Microscopic Characterization of Materials
Mikroskopisk karaktärisering av material

KASN15, 7.5 credits, A (Second Cycle)

Valid for: 2024/25
Faculty: Faculty of Engineering LTH
Decided by: PLED B/K
Date of Decision: 2024-04-17
Effective: 2024-05-08

General Information

Depth of study relative to the degree requirements: Second cycle, in-depth level of the course cannot be classified
Elective for: K4-m, N4-m
Language of instruction: The course will be given in English on demand

Aim

The course will provide advanced knowledge of materials characterization on the nanometre scale, with a focus on electron microscopy-based methods. The aim is that the student, through understanding of the underlying physical principles, will be able to: choose suitable methods for a given problem, execute the analysis in practice, and correctly report the results. Furthermore, the student should be able to independently acquire and compile knowledge on current methods of element analysis on the

nanometre scale.

Learning outcomes

Knowledge and understanding
For a passing grade the student must

• Be able to apply knowledge on electron structure in order to predict properties like X-ray emission and secondary electron emission.
• Understand electron scattering in solid materials
• Understand the principles underlying various imaging methods in electron microscopy.
• Understand the working principles of different detectors for e.g. spectroscopy.
• Understand the working principles of sample preparation methods, and their area of applicability.

Competences and skills
For a passing grade the student must

• Be able to plan adequate preparation methods for various types of materials.
• Apply her/his knowledge for choosing suitable methods for a given material question.
• Be able to analyse images and spectra of various types of materials, both qualitatively and quantitatively.
• Be able to independently execute the planned characterization on a number of different instrument types.
• Be able to present results from microscopic characterization orally and in writing.

Judgement and approach
For a passing grade the student must

• Have a critical approach to accuracy and precision with the various methods of analysis.
• Be able to evaluate and explain artefacts and sources of errors.
• Demonstrate the ability to independently plan and execute analysis of unknown materials

Contents

• Sample preparation methods
• Elastic and inelastic scattering
• Principles and functions of different types of electron microscopes (TEM, SEM)
• Imaging and diffraction with electrons.
• Spectroscopic methods for element analysis: energy dispersive X-ray spectroscopy (XEDS), electron energy loss spectroscopy (EELS).
• Identification and quantification of images and spectra.
• New and advanced microscopy topics selected by students.

Examination details

Grading scale: TH - (U, 3, 4, 5) - (Fail, Three, Four, Five)
Assessment:

Oral examination and passed analysis exercise. The results of the examination define final grade.  

The examiner, in consultation with Disability Support Services, may deviate from the regular form of examination in order to provide a permanently disabled student with a form of examination equivalent to that of a student without a disability.

Modules
Code: 0124. Name: Microscopic Characterization of Materials.
Credits: 5.0. Grading scale: TH - (U, 3, 4, 5). Assessment: Oral examination of the course content. The module includes: Lectures, exercises, laboratory exercises, and course literature according to separate reading instructions.
Code: 0224. Name: Materials Characterization Project.
Credits: 2.5. Grading scale: UG - (U, G). Assessment: Written report and oral presentation of results. The module includes: Laboratory-based group project addressing a material question using electron microscopy based methods.

Admission

Admission requirements:

• KASF15 Materials Analysis at the Nanoscale

Reading list

• Williams, David B.; Carter, C. Barry: Transmission Electron Microscopy - A Textbook for Materials Science. Boston, MA : Springer US, 2009, ISBN: 9780387765013. Available online, or can be ordered as "MyCopy" softcover.
• Egerton, Ray F: Physical Principles of Electron Microscopy [electronic resource] An Introduction to TEM, SEM, and AEM. Boston, MA : Springer Science+Business Media, Inc, 2016, ISBN: 9783319398778. Available online.
  https://link.springer.com/book/10.1007/b136495
• Material available on Canvas.

Contact

Course coordinator: Martin Ek Rosén, martin.ek_rosen@chem.lu.se
Course coordinator: Reine Wallenberg, reine.wallenberg@chem.lu.se

Further information

The course is based on independent work. The use of generative artificial intelligence (GAI) is permitted for self-study but may not be used for examination activities such as laboratory reports, assignments, assignments and exams.