Materials Analysis at the Nanoscale
Analys på nanoskalan

KASF15, 7.5 credits, G2 (First Cycle)

Valid for: 2024/25
Faculty: Faculty of Engineering LTH
Decided by: PLED B/K
Date of Decision: 2024-04-17
Effective: 2024-05-08

General Information

Main field: Technology Depth of study relative to the degree requirements: First cycle, in-depth level of the course cannot be classified
Main field: Nanoscience Depth of study relative to the degree requirements: First cycle, in-depth level of the course cannot be classified
Mandatory for: MNAV1, N3
Elective for: K4-m
Language of instruction: The course will be given in English

Aim

• The student should acquire an active base of knowledge on methods for morpholgical, structural and elemental analysis on a nanometer scale.
• The student should understand the mechanisms behind the different analysis methods.

Learning outcomes

Knowledge and understanding
For a passing grade the student must

• be able to use acquired knowledge of electronic structure to predict properties like x-ray emission, Auger electron emission or secondary electron emission
• understand the principle of elastic and inelastic electron scattering in solid materials
• understand the principles of imaging with microscopy methods
• understand electron- and light induced phenomena on surfaces and the subsequent emission or reflection

Competences and skills
For a passing grade the student must

• be able to apply their knowledge to choose a suitable method of analysis for a particular problem
• be able to analyse images and spectra from different materials, both qualitatively and quantitatively

Judgement and approach
For a passing grade the student must

• be able to evaluate accuracy and precision for different methods of analysis
• explain possible artefacts and sources of error.

Contents

• Overview of solid state micro analysis methods.
• The electron microscope as an analytical tool.
• Identification of phases by morphology, chemical composition, electron diffraction and high resolution transmission electron microscopy.
• Scanning electron microscopy.
• XEDS and EELS for elemental analysis.
• Methods for surface analysis: Atomic force microscopy, Scanning tunnelling microscopy, LEED, X-ray photoelectron spectroscopy (XPS)

Examination details

Grading scale: TH - (U, 3, 4, 5) - (Fail, Three, Four, Five)
Assessment:

Written final examination. Written midterm examination after approx. 4 weeks which can count for bonus points on the final grade with a passed final examination.T

The examiner, in consultation with Disability Support Services, may deviate from the regular form of examination in order to provide a permanently disabled student with a form of examination equivalent to that of a student without a disability.

Modules
Code: 0117. Name: Nanoscale Analysis.
Credits: 7.5. Grading scale: TH - (U, 3, 4, 5).

Admission

The number of participants is limited to: No
Kursen överlappar följande kurser: KOO105

Reading list

• DB Williams and BC Carter: Transmission Electron Microscopy. Springer, 2009, ISBN: 978-0-387-76501-3 (e-book), 9780387765020 (print). The e-book is available for free download from Springer.com within the LU network. The print book is identical and also acceptable as literature for the course.
• G Attard and C Barnes: Surfaces. Oxford University Press, 1998, ISBN: 0-19-855686-1.

Contact

Course coordinator: Kimberly Dick Thelander, kimberly.thelander@ftf.lth.se
Course coordinator: Rainer Timm, rainer.timm@sljus.lu.se
Course coordinator: Reine Wallenberg, reine.wallenberg@chem.lu.se

Further information

The course is based on independent work. The use of generative artificial intelligence (GAI) is permitted for self-study but may not be used for examination activities such as laboratory reports, assignments, assignments and exams.