Course syllabus
Mikroskopisk karaktärisering av material
Microscopic Characterization of Materials
KASN15, 7,5 credits, A (Second Cycle)
Valid for: 2019/20
Decided by: PLED B/K
Date of Decision: 2019-03-29
General Information
Elective for: K4-m, N4-m
Language of instruction: The course will be given in English on demand
Aim
- to acquire and compile knowledge on current methods of element
analysis on nanometer scale
- to understand the processes behind the different methods of
analysis
- to be able to execute an analysis in practice
Learning outcomes
Knowledge and understanding
For a passing grade the student must
- be able to apply his/her knowledge on electron structure in
order to predict properties like x-ray emission and Auger electron
emission
- understand elastic and inelastic electron scattering in solid
materials
- understand the principles of imaging with various methods of
microscopy
- understand the working mode of different detectors
Competences and skills
For a passing grade the student must
- be able to plan adequate preparation methods for various types
of materials
- apply his/her knowledge on choosing adequate methods for
analysis of certain materials
- be able to analyse images and spectra of various types of
materials, both quality and quantity
- independently execute analysis according to plan
Judgement and approach
For a passing grade the student must
- be able to evaluate accuracy and precision with the various
methods of analysis
- be able to explain artefacts and sources of errors
- demonstrate the ability to plan and execute analysis of unknown
materials
Contents
- Elastic and inelastic scattering
- Magnetic lenses
- Principles and functions of different types of electron
microscopes (TEM, SEM)
- Spectrometers for element analysis, Energy dispersive x-ray
spectrometer (XEDS), Electron energy ions spectrometer (EELS)
- Identification and quantification of spectra.
- Biological sample preparation and imaging techniques
Examination details
Grading scale: TH - (U,3,4,5) - (Fail, Three, Four, Five)
Assessment: Written examination and passed analysis exercise. The results of the examination define final grade.
The examiner, in consultation with Disability Support Services, may deviate from the regular form of examination in order to provide a permanently disabled student with a form of examination equivalent to that of a student without a disability.
Admission
Admission requirements:
- KASF15 Materials Analysis at the Nanoscale
The number of participants is limited to: 12
Selection: Completed university credits within the programme. Priority is given to students enrolled on programmes that include the course in their curriculum.
Reading list
- Williams, D B och Carter, B C: Transmission electron microscopy – a textbook for materials science, 2nd edition. Springer, 2009, ISBN: 978-0-387-76502-0 eller e-ISBN: 978-0-387-76501-3.
- Compendia.
Contact and other information
Course coordinator: Professor Reine Wallenberg, Reine.Wallenberg@polymat.lth.se
Course homepage: http://www.polymat.lth.se