Course syllabus

Mikroskopisk karaktärisering av material
Microscopic Characterization of Materials

KOO065, 7,5 credits, A (Second Cycle)

Valid for: 2016/17
Decided by: Education Board C
Date of Decision: 2016-04-12

General Information

Elective for: K4-m, N4-m
Language of instruction: The course will be given in English on demand

Aim

• to acquire and compile knowledge on current methods of element analysis on nanometer scale
• to understand the processes behind the different methods of analysis
• to be able to execute an analysis in practice

Learning outcomes

Knowledge and understanding
For a passing grade the student must

• be able to apply his/her knowledge on electron structure in order to predict properties like x-ray emission and Auger electron emission
• understand elastic and inelastic electron scattering in solid materials
• understand the principles of imaging with various methods of microscopy
• understand the working mode of different detectors

Competences and skills
For a passing grade the student must

• be able to plan adequate preparation methods for various types of materials
• apply his/her knowledge on choosing adequate methods for analysis of certain materials
• be able to analyse images and spectra of various types of materials, both quality and quantity
• independently execute analysis according to plan

Judgement and approach
For a passing grade the student must

• be able to evaluate accuracy and precision with the various methods of analysis
• be able to explain artefacts and sources of errors
• demonstrate the ability to plan and execute analysis of unknown materials

Contents

• Elastic and inelastic scattering
• Magnetic lenses
• Principles and functions of different types of electron microscopes (TEM, SEM)
• Spectrometers for element analysis, Energy dispersive x-ray spectrometer (XEDS), Electron energy ions spectrometer (EELS)
• Identification and quantification of spectra.
• Biological sample preparation and imaging techniques

Examination details

Grading scale: TH
Assessment: Written examination and passed analysis exercise. The results of the examination define final grade.

Admission

Admission requirements:

• KOO105 Materials Analysis at the Nanoscale

The number of participants is limited to: 12
Selection: Credits remaining for the degree.

Reading list

• Williams, D B och Carter, B C: Transmission electron microscopy – a textbook for materials science, 2nd edition. Springer, 2009, ISBN: 978-0-387-76502-0 eller e-ISBN: 978-0-387-76501-3.
• Compendia.

Contact and other information

Course coordinator: Professor Reine Wallenberg, Reine.Wallenberg@polymat.lth.se
Course homepage: http://www.polymat.lth.se