Aim

• to acquire and compile knowledge on current methods of element analysis on nanometer scale

• to understand the processes behind the different methods of analysis

• to be able to execute an analysis in practice

Knowledge and understanding
For a passing grade the student must

• be able to apply his/her knowledge on electron structure in order to predict properties like x-ray emission and Auger electron emission

• understand elastic and inelastic electron scattering in solid materials

• understand the principles of imaging with various methods of microscopy

• understand the working mode of different detectors

Skills and abilities
For a passing grade the student must

• be able to plan adequate preparation methods for various types of materials

• apply his/her knowledge on choosing adequate methods for analysis of certain materials

• be able to analyse images and spectra of various types of materials, both quality and quantity

• independently execute analysis according to plan

Judgement and approach
For a passing grade the student must

• be able to evaluate accuracy and precision with the various methods of analysis

• be able to explain artefacts and sources of errors

• demonstrate the ability to plan and execute analysis of unknown materials

Contents

• Elastic and inelastic scattering

• Magnetic lenses

• Principles and functions of different types of electron microscopes (TEM, SEM)

• Spectrometers for element analysis, Energy dispersive x-ray spectrometer (XEDS), Electron energy ions spectrometer (EELS)

• Identification and quantification of spectra.

• Biological sample preparation and imaging techniques

Literature
Williams, D B och Carter, B C: Transmission electron microscopy – a textbook for materials science, 2nd edition. Springer 2009. ISBN: 978-0-387-76502-0; e-ISBN: 978-0-387-76501-3.
Compendia.