Syllabus 2008/2009 FAF085

Syllabus academic year 2008/2009
(Created 2008-07-17.)

SCANNING PROBE MICROSCOPY

FAF085

Higher education credits: 7,5. Grading scale: TH. Level: A (Second level). Language of instruction: The course might be given in English. Optional for: F4, F4nfe, MNAV4, N4, N4nf. Course coordinator: Docent Dr. Anders Mikkelsen, anders.mikkelsen@sljus.lu.se, Fysik, kurslaboratoriet. Recommended prerequisits: Basic courses in quantum physics and solid state physics. The course might be cancelled if the numer of applicants is less than 6. The number of participants is limited to 20 Selection criteria: 1. Field of degree project. 2. Credits awarded or credited within the study programme. 3. Final grades on courses given within the study programme. Assessment: The assessment of the course consists of laboratory exercises and a project. The results of the project is presented with a written report and an oral presentation on a seminar. The final grade of the student is based on the laboratory exercises (30%) and the project (70%). Further information: The course may be given in english. Home page: http://www.sljus.lu.se/staff/anders.

Aim
The course deals with the exciting field of high-resolution microscopy using scanning probe methods. Today these techniques have found their use in a wide range of research areas from advanced physics and chemistry with atomic precision to applications in biology, such as studies of single cells and viruses. The course will encompass both theoretical and practical aspects of handling and possible applications of SPM. The techniques of STM (Scanning Tunneling Microscopy) and AFM (Atomic Force Microscopy) will be given particular attention.

Knowledge and understanding
For a passing grade the student must

be able to explain and describe the basic physical principles that are utilized during imaging with AFM and STM.
be able to explain and describe the interpretation of measurement data.
be able to describe the SPM methods and sensor applications that have been developed from STM and AFM.
be able to describe possibilities and limitations with SPM methods.
be able to evaluate and choose suitable SPM method for a specific task.

Skills and abilities
For a passing grade the student must

be able to use AFM for imaging.
be able to write well-organized project reports that concludes, explains and analyzes experimental and/or theoretical research results.
be able to independently search for information in addition to the course literature.
be able to integrate knowledge from the course in scientific discussions.

Contents
Introduction to scanning probe microscopy. Instrumentation: positioning devices, probes, data acquisition/electronics and vibration isolation concepts. STM: principle and practical applications, methods for imaging and spectroscopy, sample and probe preparation. AFM: principle and practical applications, methods for imaging, force curves, sample and probe preparation. Related SPM techniques: principles and practical applications;Applications of SPM in: condensed matter, chemistry, nanotechnology and biology. Data processing and interpretation. Sensor applications based on SPM.

In addition to the lectures, the course also contains laboratory exercises and a project, which ends with a seminar.

Literature
Bonnel, D., "Scanning Probe Microscopy and Spectroscopy 2nd edition", Wiley-VHC, 2001, ISBN 0-471-24824-X