Aim

• The student should acquires an active base of knowledge on methods for elemental analysis on a nanometer scale.

• The student should understand the mechanisms behind the different analysis methods.

Knowledge and understanding
For a passing grade the student must

• be able to use acquired knowledge to predict properties like x-ray emission, Auger electron emission or secondary electron emission

• understand the principle of elastic and inelastic scattering in solid material

• understand the principle of imaging with microscopy methods

• understand electron- and light induced phenomena on surfaces and the subsequent emission or reflection

Skills and abilities
For a passing grade the student must

• be able to plan suitable methods of preparation of different types of materials, for analysis

• be able to apply their knowledge to choose a suitable method of analysis for a particular problem

• be able to analyse images and spectra from different materials, both qualitatively and quantitatively

Judgement and approach
For a passing grade the student must

• be able to evaluate accuracy and precision for different methods of analysis

• explain possible artefacts and sources of error.

Contents

• Overview of solid state micro analysis methods.

• The electron microscope as an analytical tool.

• Identification of phases by morphology, chemical composition, electron diffraction and high resolution transmission electron microscopy.

• Scanning electron microscopy.

• XEDS and EELS for element analysis.

• Atomic force microscopy.

• Scanning tunnelling microscopy.

• LEED. Problems in preparation, imaging and interpretation of inorganic/biological samples.

• Synchrotron based analysis.

• X-ray photoelectron spectroscopy (XPS)

Literature
Williams, D B and Carter, B C: Transmission electron microscopy – a textbook for materials science. Plenum Press 1996. ISBN: 0-306-45324-X.
Attard, G and Barnes, C: Surfaces: Oxford Chemistry Primer no. 59. Oxford University Press 1998. ISBN 0-19-855686-1.
Compendia.